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[¼Ö·ç¼Ç] ¿­Àü´Þ 6ÆÇ(Heat and mass transfer) - incropera, wiley ch1-11Àå (ÁÖ¿ä¹®Á¦Ç®ÀÌ·Î µÇÀÖ½À´Ï´Ù.) PROBLEM 1.41 KNOWN: Hot plate-type wafer thermal processing tool based upon heat transfer modes by conduction through gas within the gap and by radiation exchange across gap. FIND: (a) Radiative and conduction heat fluxes across gap for specified hot plate and wafer temperatures and gap separation; initial time rate of change in wafer temperature for each mode, and (b) heat fluxes and initial temperature-time change for gap separations of 0.2, 0.5 and 1.0 mm for hot plate temperatures 300 < Th < 1300¡ÆC. Comment on the relative importance of the modes and the influence of the gap distance. Under what conditions could a wafer be heated to 900¡ÆC in less than 10 seconds? SCHEMATIC: ASSUMPTIONS: (1) Steady-state conditions for flux calculations, (2) Diameter of hot plate and wafer much larger than gap spacing, approximating plane, infinite planes, (3) One-dimensional conduction through gas, (4) Hot plate and wafer are blackbodies, (5) Negligible heat losses from wafer backside, and (6) Wafer temperature is uniform at the onset of heating. PROPERTIES: Wafer: r = 2700 kg/m3, c = 875 J/kg¡¿K; Gas in gap: k = 0.0436 W/m¡¿K. ANALYSIS: (a) The radiative heat flux between the hot plate and wafer for Th = : :
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